GISAS by rough interfaces

Scattering from a multilayered sample with correlated roughness.

  • The sample is composed of a substrate on which is sitting a stack of layers. These layers consist in a repetition of 5 times two different superimposed layers (from bottom to top):
    • layer A: $2.5$ nm thick with a real refractive index $n = 5 \cdot 10^{-6}$.
    • layer B: $5$ nm thick with a real refractive index $n = 10 \cdot 10^{-6}$.
  • There is no added particle.
  • All layers present the same type of roughness on the top surface, which is characterized by:
    • a rms roughness of the interfaces $\sigma = 1$ nm,
    • a Hurst parameter $H$ equal to $0.3$,
    • a lateral correlation length $\xi$ of $5$ nm,
    • a common cross correlation length $\xi_{\perp}$ equal to $10$ nm,
    • a height distribution is normal.
  • The incident beam is characterized by a wavelength of 0.1 nm.
  • The incident angles are $\alpha_i = 0.2 ^{\circ}$ and $\varphi_i = 0^{\circ}$.

So the model with SelfAffineFractalModel, ErfTransient, CommonDepthCrosscorrelation is used here.

auto/Examples/scatter2d/CorrelatedRoughness.py